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(parent: ee8ec04) | patch
iio: test: Add test for IIO_VAL_INT_64.
authorAndriy Tryshnivskyy <andriy.tryshnivskyy@opensynergy.com>
Fri, 5 Nov 2021 10:05:01 +0000 (12:05 +0200)
committerJonathan Cameron <Jonathan.Cameron@huawei.com>
Sat, 27 Nov 2021 16:33:45 +0000 (16:33 +0000)
commit1d9b750c92d738cb84eb1531dd85147466202b86
treedf58a1c6813f32c36732004e5dd40176bd480cc9tree | snapshot
parentee8ec048e091bfe36cc463e7a30eefbe5fef3e75commit | diff
iio: test: Add test for IIO_VAL_INT_64.

Add test for newly introduced type IIO_VAL_INT_64.

Signed-off-by: Andriy Tryshnivskyy <andriy.tryshnivskyy@opensynergy.com>
Reported-by: kernel test robot <lkp@intel.com>
Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
Link: https://lore.kernel.org/r/20211105100501.1904-3-andriy.tryshnivskyy@opensynergy.com
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
drivers/iio/test/iio-test-format.c diff | blob | history
ep93xx device tree rework repo: git://git.maquefel.me/linux.git