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(parent: d0a9ddc) | patch
tests: line: remove a bad test case
authorBartosz Golaszewski <bgolaszewski@baylibre.com>
Wed, 16 Dec 2020 09:58:57 +0000 (10:58 +0100)
committerBartosz Golaszewski <bgolaszewski@baylibre.com>
Wed, 16 Dec 2020 09:58:57 +0000 (10:58 +0100)
commit4e201331b11b2bd693e4c8a8d3144da471f60cc6
treead06e9d9e21146417e9b49cf11fc0d8123a448b1tree | snapshot
parentd0a9ddcb9cfe199cffcb6946dcc8b6e358b128ffcommit | diff
tests: line: remove a bad test case

The test case for requesting multiple lines exposed by different chips
has never been correct. The request call does indeed fail with EINVAL
but now that we've disallowed adding lines from different chips to
the same bulk object, this happens only because we're using a wrong
constant in the flags field of the request structure.

Remove the entire test as it's no longer required.

Signed-off-by: Bartosz Golaszewski <bgolaszewski@baylibre.com>
tests/tests-line.c diff | blob | history
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