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(parent: 6b6bed2) | patch
tests: add a new cleanup macro
authorBartosz Golaszewski <bartekgola@gmail.com>
Thu, 22 Feb 2018 20:21:56 +0000 (21:21 +0100)
committerBartosz Golaszewski <bartekgola@gmail.com>
Thu, 22 Feb 2018 20:21:56 +0000 (21:21 +0100)
commit5c5a4ca9b3b58495aa3578235ad94bab22f3c602
tree56246791ed18b77cb0e4213aefe7a663ed5ca226tree | snapshot
parent6b6bed27cc7b31d87c5dfc9792f4f7165d73a1f9commit | diff
tests: add a new cleanup macro

The most commonly used cleanup attribute is the one used for automatic
closing of GPIO chips. For brevity: hide the long TEST_CLEANUP(...)
invocation behind a shorter TEST_CLEANUP_CHIP macro.

Signed-off-by: Bartosz Golaszewski <bartekgola@gmail.com>
tests/gpiod-test.h diff | blob | history
tests/tests-chip.c diff | blob | history
tests/tests-event.c diff | blob | history
tests/tests-gpioinfo.c diff | blob | history
tests/tests-iter.c diff | blob | history
tests/tests-line.c diff | blob | history
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