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media: ov2640: add V4L2_CID_TEST_PATTERN control
authorAkinobu Mita <akinobu.mita@gmail.com>
Mon, 12 Nov 2018 16:00:50 +0000 (11:00 -0500)
committerMauro Carvalho Chehab <mchehab+samsung@kernel.org>
Fri, 23 Nov 2018 09:45:49 +0000 (04:45 -0500)
commit6210500691b21e1f755b0076dd54fdb31236e2de
tree318db053b293a47d2896f13524c849afb2f0bfe3tree | snapshot
parentdde64f725a4d0afa7a589292365afe5759af7388commit | diff
media: ov2640: add V4L2_CID_TEST_PATTERN control

The ov2640 has the test pattern generator features.  This makes use of
it through V4L2_CID_TEST_PATTERN control.

[Sakari Ailus: Use "Eight Vertical Colour Bars" as the second manu entry]

Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
drivers/media/i2c/ov2640.c diff | blob | history
ep93xx device tree rework repo: git://git.maquefel.me/linux.git