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(parent: 9e27471) | patch
selftests/tc-testing: add selftests for gred qdisc
authorZhengchao Shao <shaozhengchao@huawei.com>
Sat, 24 Sep 2022 02:51:48 +0000 (10:51 +0800)
committerDavid S. Miller <davem@davemloft.net>
Wed, 28 Sep 2022 07:32:54 +0000 (08:32 +0100)
commita4a8d3562b07e7390708c9d6dc85932fceffe8af
tree470a0e07e71e9bbe339df25d7b95f60b878dd8e8tree | snapshot
parent9e274718cc050874761ad4314d43cd82e7556128commit | diff
selftests/tc-testing: add selftests for gred qdisc

Test 8942: Create GRED with default setting
Test 5783: Create GRED with grio setting
Test 8a09: Create GRED with limit setting
Test 48cb: Create GRED with ecn setting
Test 763a: Change GRED setting
Test 8309: Show GRED class

Signed-off-by: Zhengchao Shao <shaozhengchao@huawei.com>
Signed-off-by: David S. Miller <davem@davemloft.net>
tools/testing/selftests/tc-testing/config diff | blob | history
tools/testing/selftests/tc-testing/tc-tests/qdiscs/gred.json [new file with mode: 0644] blob
ep93xx device tree rework repo: git://git.maquefel.me/linux.git