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media: ov7670: add V4L2_CID_TEST_PATTERN control
authorAkinobu Mita <akinobu.mita@gmail.com>
Fri, 24 Nov 2017 14:40:45 +0000 (09:40 -0500)
committerMauro Carvalho Chehab <mchehab@s-opensource.com>
Fri, 8 Dec 2017 14:23:12 +0000 (09:23 -0500)
commitb48d908d2b04e5c11bf0f9035bf52f7c0c988603
tree08408a95f73dece6f311a3b31b25b19f42554ae6tree | snapshot
parent344aa836e813a6b097c23f2e0633dd17f62c2ed7commit | diff
media: ov7670: add V4L2_CID_TEST_PATTERN control

The ov7670 has the test pattern generator features.  This makes use of
it through V4L2_CID_TEST_PATTERN control.

Cc: Jonathan Corbet <corbet@lwn.net>
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab@s-opensource.com>
drivers/media/i2c/ov7670.c diff | blob | history
ep93xx device tree rework repo: git://git.maquefel.me/linux.git