selftests/xsk: Add new test case for AF_XDP under max ring sizes

selftests/xsk: Add new test case for AF_XDP under max ring sizes

Introduce a test case to evaluate AF_XDP's robustness by pushing hardware
and software ring sizes to their limits. This test ensures AF_XDP's
reliability amidst potential producer/consumer throttling due to maximum
ring utilization. The testing strategy includes:

1. Configuring rings to their maximum allowable sizes.
2. Executing a series of tests across diverse batch sizes to assess
   system's behavior under different configurations.

Signed-off-by: Tushar Vyavahare <tushar.vyavahare@intel.com>
Signed-off-by: Daniel Borkmann <daniel@iogearbox.net>
Acked-by: Magnus Karlsson <magnus.karlsson@intel.com>
Link: https://lore.kernel.org/bpf/20240402114529.545475-8-tushar.vyavahare@intel.com