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Blackfin: isram: clean up ITEST_COMMAND macro and improve the selftests
authorMike Frysinger <vapier@gentoo.org>
Tue, 4 May 2010 04:14:08 +0000 (04:14 +0000)
committerMike Frysinger <vapier@gentoo.org>
Sat, 22 May 2010 18:19:10 +0000 (14:19 -0400)
commitc70dcabc8eba18113a4735e7b1bd09f7493e38f0
tree80f2ca9f649b05b2bf0de3027061664db8454748tree | snapshot
parent479ba6035862a9c08ce4351c7fff8926fde4ede5commit | diff
Blackfin: isram: clean up ITEST_COMMAND macro and improve the selftests

The IADDR2DTEST() macro had some duplicated logic with bit 11 and some
incorrect comments, so scrub all of that.

In order to verify these aren't a problem (and won't be in the future),
extend the self tests to operate on as much L1 SRAM as possible.

Signed-off-by: Mike Frysinger <vapier@gentoo.org>
arch/blackfin/mm/isram-driver.c diff | blob | history
ep93xx device tree rework repo: git://git.maquefel.me/linux.git