tests: rename a couple static functions

We use the 'test_' prefix to mark the testing framework API
definitions. Don't use it for static functions in gpiod-test.c.

Signed-off-by: Bartosz Golaszewski <bartekgola@gmail.com>

diff --git a/tests/gpiod-test.c b/tests/gpiod-test.c
index 8dfa913c008f4c6dc93e7cc2ab9a409ff816f34c..60e9b660e1010b60b830175c093d9ebf73239e9a 100644 (file)
--- a/tests/gpiod-test.c
+++ b/tests/gpiod-test.c
@@ -369,7 +369,7 @@ static void check_gpio_mockup(void)
        msg("gpio-mockup ok");
 }
 
-static void test_load_module(struct _test_chip_descr *descr)
+static void load_module(struct _test_chip_descr *descr)
 {
        unsigned int i;
        char *modarg;
@@ -404,7 +404,7 @@ static bool devpath_is_mockup(const char *devpath)
        return !strncmp(devpath, mockup_devpath, sizeof(mockup_devpath) - 1);
 }
 
-static void test_prepare(struct _test_chip_descr *descr)
+static void prepare_test(struct _test_chip_descr *descr)
 {
        const char *devpath, *devnode, *sysname;
        struct udev_monitor *monitor;
@@ -445,7 +445,7 @@ static void test_prepare(struct _test_chip_descr *descr)
        if (status < 0)
                die_perr("error enabling udev event receiving");
 
-       test_load_module(descr);
+       load_module(descr);
 
        pfd.fd = udev_monitor_get_fd(monitor);
        pfd.events = POLLIN | POLLPRI;
@@ -497,7 +497,7 @@ static void test_prepare(struct _test_chip_descr *descr)
        qsort(ctx->chips, ctx->num_chips, sizeof(*ctx->chips), chipcmp);
 }
 
-static void test_run(struct _test_case *test)
+static void run_test(struct _test_case *test)
 {
        print_header("TEST", CYELLOW);
        pr_raw("'%s': ", test->name);
@@ -521,7 +521,7 @@ static void test_run(struct _test_case *test)
        }
 }
 
-static void test_teardown(void)
+static void teardown_test(void)
 {
        struct mockup_chip *chip;
        struct event_thread *ev;
@@ -577,9 +577,9 @@ int main(int argc TEST_UNUSED, char **argv TEST_UNUSED)
        msg("running tests");
 
        for (test = globals.test_list_head; test; test = test->_next) {
-               test_prepare(&test->chip_descr);
-               test_run(test);
-               test_teardown();
+               prepare_test(&test->chip_descr);
+               run_test(test);
+               teardown_test();
        }
 
        if (!globals.tests_failed)