tests: fix mapping of chip numbers

After recent changes the tests stopped working when other (non mockup)
GPIO chips are present in the system. The reason for that is broken
mapping of chip numbers to chip indexes. This patch fixes it.

Signed-off-by: Bartosz Golaszewski <bgolaszewski@baylibre.com>

diff --git a/tests/gpiod-test.c b/tests/gpiod-test.c
index ca9761ad50d193fc26c6bf792e6b73706b50522a..b8551310ebcacf9ba451634d704f8bab4cea4ae9 100644 (file)
--- a/tests/gpiod-test.c
+++ b/tests/gpiod-test.c
@@ -1138,7 +1138,8 @@ int test_debugfs_get_value(unsigned int chip_index, unsigned int line_offset)
        char buf;
        int fd;
 
-       fd = test_debugfs_open(chip_index, line_offset, O_RDONLY);
+       fd = test_debugfs_open(globals.test_ctx.chips[chip_index]->number,
+                              line_offset, O_RDONLY);
 
        rd = read(fd, &buf, 1);
        if (rd < 0)
@@ -1159,7 +1160,8 @@ void test_debugfs_set_value(unsigned int chip_index,
        ssize_t wr;
        int fd;
 
-       fd = test_debugfs_open(chip_index, line_offset, O_WRONLY);
+       fd = test_debugfs_open(globals.test_ctx.chips[chip_index]->number,
+                              line_offset, O_WRONLY);
 
        buf[0] = val ? '1' : 0;
        buf[1] = '\n';
@@ -1221,7 +1223,7 @@ void test_set_event(unsigned int chip_index,
                ev->running = true;
        }
 
-       ev->chip_index = chip_index;
+       ev->chip_index = globals.test_ctx.chips[chip_index]->number;
        ev->line_offset = line_offset;
        ev->freq = freq;